Scope

The International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP) is a conference on physics of semiconductors with special emphasis on defects. It covers application aspects as well as fundamental questions regarding the physics of defects.

Main areas of interest are

• The physics of active defects in elemental and compound semiconductors
• Experimental ways to get information on defects by means of imaging and spectroscopy
• The effects of imperfections on properties of bulk semiconductors, epitaxial layers, and interfaces
• The qualification and reliability of electronic or optoelectronic devices in relation to defects or imperfections in the materials assessed by imaging or mapping.

DRIP is particularly suited for anybody working, having specific needs, or simply being interested in getting up-to-date with the fields of visualization, imaging, identification, and understanding of defects which affect the operation of semiconductor devices. The trend towards features with smaller and smaller critical dimensions, with all the associated physics involved (such as novel quantum effects...) is one of the important driving forces behind this. At the other end of the scale, there is a need for development of tools capable of producing images over whole wafers of increasing size. The field covered by DRIP can be described as "going from the extremely small to the extremely large", a concept now familiar to many other areas of science. The main challenge of this conference is to link defect images, transport/optical properties, and performance of the actual devices.

The purpose of DRIP is to provide a forum for scientists/engineers from universities, government institutes, and industry to meet and discuss methods used for the recognition and imaging of defects in semiconductor materials and semiconductor devices. The conference includes investigations of defects in the raw materials (wafer level), process-induced defects, and defects that appear during operation (burn-in, aging tests, ...). The primary concern of DRIP is the methodology and the physics of measurement procedures, together with specific developments in instrumentation.

DRIP has a history of more than 20 years. So far there have been 11 successful conferences in Europe, Asia, and America. DRIP XII will be held in 2007, 9^th - 13^th September, in Berlin.

Topics

• New frontiers of atomic-scale-defect assessment using nanoprobe methods (STM, AFM, SNOM, ballistic electron energy microscopy, ...).
• Submicron 2D and 3D optical imaging (classical and UV microscopy, confocal microscopy, scanning interference microscopy, laser scanning tomography, ...).
• Spectroscopic techniques (PL and micro-PL, Raman and micro-Raman, ...).
• Contactless electrical characterization techniques.
• Defect imaging using electrical transport characterization techniques.
• Electron beam methods (TEM, EBIC, cathodoluminescence, ...).
• X-ray based techniques (topography, diffractometry, fluorescence, ...).
• Defect mapping (of any type) over large area wafers.
• Defect analysis in degraded optoelectronic and electronic devices.
• Defects and degradation of organic semiconductors and devices.
• Strategies for correlation and interpretation of results of different techniques.
• In-situ diagnostics and process control.
• Specific sessions on defects in various classes of semiconductor materials with respect to their fields of application (bulk or epitaxial Si, III-V's for optoelectronics, III-V's for micro-wave electronics, wide bandgap semiconductors, Si-based thin films for large-area electronics, ...).

Venue

DRIP XII will be held from September 9^th till September 13^th 2007 in the Courtyard by Marriott Hotel in Berlin-Köpenick, a four star hotel suited at the banks of the river Dahme. The hotel is located in the greenest part of Berlin opposite the old town of Köpenick and the castle. Most of the rooms have river-view.
The hotel provides all comfort for a conference, including wireless high speed internet access in every room. In the lobby a little exhibition will be organized.

For further information click

          http://marriott.com/property/propertypage/bercy?WT_Ref=mi_left

For hotel reservation go to

          http://cwp.marriott.com/bercy/dripxiiconference

Single and double rooms will be available at a special rate of 75 € per night for conference attendees and accopanying persons. This rate is also valid for additional days before or after the conference. Reservations should be made directly with the hotel.

The campus in Berlin-Adlershof, where the Max-Born-Institut and the Ferdinand-Braun-Institut are located can be reached by public transport in 15 min time.