DRIP XII  Berlin

12th International Conference on
Defects-Recognition, Imaging
and Physics in Semiconductors

Logo DRIP

Program

Invited Speakers

Martin Albrecht, Institut für Kristallzüchtung (Germany)

Tilo Baumbach, Universität Karlsruhe (Germany)

Tonio Buonassisi, Massachusetts Institute of Technology (USA)

Mark S. Goorsky, University of California, Los Angeles (USA)

Colin Humphreys, University of Cambridge (UK)

Martin Kuball, University of Bristol (UK)

Abdelmadjid Mesli, Laboratoire InESS (France)

Julien Nagle, Thales Research and Technology (France)

James Speck, University of California, Santa Barbara (USA)

Eicke Weber, Fraunhofer Institut für Solare Energiesysteme (Germany)

Hiroshi Yamada-Kaneta, Niigata University (Japan)

Special Session

Within the conference a special session "Defects in Devices" is offered on Wednesday, September 12th. This session is supported by BRIGHTER.EU, an integrated project which is funded by the European Commission.

Program of oral presentations you find here

Program of poster presentations you find here